Mathematical modelling and optimization of multisite efficiency to reduce cost of test in semiconductor final test process using Taguchi method
This study proposes improved equations for semiconductor multisite testing process. It contributes to the derivation of the new equations which have better prediction accuracy of multisite efficiency (MSE), testing throughput, and cost of test than the conventional ones to enable accurate conduct of...
Saved in:
| 主要作者: | |
|---|---|
| 格式: | Thesis |
| 语言: | English |
| 出版: |
2021
|
| 主题: | |
| 在线阅读: | http://eprints.utm.my/108141/1/KhooVoonChingPFTIR2021.pdf |
| 标签: |
添加标签
没有标签, 成为第一个标记此记录!
|