System-on-chip (SoC) testing using adhoc high-level design for-testability method

System-on-chip (SoC) testing using adhoc high-level design for-testability method

The design of System-on-Chip (SoC) is becoming more complex and number of transistors in a chip has increased from millions of gates to billions of gates nowadays but the number of Input/Output pins still remains about the same. In this case, design-for-test (DFT) becomes so important in order to ma...

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书目详细资料
主要作者:	Cheng, Chen Kong
格式:	Thesis
语言:	English
出版:	2009
主题:	TK Electrical engineering Electronics Nuclear engineering
在线阅读:	http://eprints.utm.my/id/eprint/18577/1/ChengChenKongMFKE2009.pdf
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