Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch

Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the st...

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Main Author:	Ismail, Muhamad Amri
Format:	Thesis
Published:	2009
Subjects:	TK Electrical engineering Electronics Nuclear engineering
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id	my-utm-ep.18888
record_format	uketd_dc
spelling	my-utm-ep.188882013-12-31T03:12:27Z Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch 2009 Ismail, Muhamad Amri TK Electrical engineering. Electronics Nuclear engineering Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the student who found commited in disciplinary problem at school. Form four parents of the student were involved in the study to explore their perception upon canning. Questionnaire is the only instrument used to explore the respondents perception. A total number of 94 parents were responded to the questionnaire. The data is analysed by using SPSS (Statistical Package For Social Sciences) Versi 11.5 For Windows. Results showed in terms of frequency, percentage and mean. It is indicated that most of the parents were agreed upon the usage of canning in disciplining their children at school (mean = 3.40; N = 94). The findings are also compared with previous results to evaluate the effectiveness of canning in school. 2009 Thesis http://eprints.utm.my/id/eprint/18888/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution	Universiti Teknologi Malaysia
collection	UTM Institutional Repository
topic	TK Electrical engineering Electronics Nuclear engineering
spellingShingle	TK Electrical engineering Electronics Nuclear engineering Ismail, Muhamad Amri Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
description	Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the student who found commited in disciplinary problem at school. Form four parents of the student were involved in the study to explore their perception upon canning. Questionnaire is the only instrument used to explore the respondents perception. A total number of 94 parents were responded to the questionnaire. The data is analysed by using SPSS (Statistical Package For Social Sciences) Versi 11.5 For Windows. Results showed in terms of frequency, percentage and mean. It is indicated that most of the parents were agreed upon the usage of canning in disciplining their children at school (mean = 3.40; N = 94). The findings are also compared with previous results to evaluate the effectiveness of canning in school.
format	Thesis
qualification_level	Master's degree
author	Ismail, Muhamad Amri
author_facet	Ismail, Muhamad Amri
author_sort	Ismail, Muhamad Amri
title	Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_short	Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_full	Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_fullStr	Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_full_unstemmed	Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_sort	modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
granting_institution	Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department	Faculty of Electrical Engineering
publishDate	2009
_version_	1747815363605692416

Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch

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