The effects of fast rise multiple lightning impulse on the physical and LC Circuit Parameters of MOV
The behaviour and performance of lightning protective devices such as metal oxide varistor under the application of multiple lightning impulse are different from the standard single stroke test. Since metal oxide varistor is the most common, economical and reliable device for low voltage and telecom...
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Main Author: | |
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Format: | Thesis |
Language: | English |
Published: |
2006
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Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/2200/1/WongIngSiongMFKE2006.pdf |
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Summary: | The behaviour and performance of lightning protective devices such as metal oxide varistor under the application of multiple lightning impulse are different from the standard single stroke test. Since metal oxide varistor is the most common, economical and reliable device for low voltage and telecommunication systems lightning protection, a precise method of testing has to be adopted based on natural characteristics of lightning to accurately determine its performance and capability. In this work, laboratory studies are to be carried out on 1kV voltage and 250A current rating metal oxide varistor (MOV). The test samples are to be subjected to multiple lightning impulses with fast rise time using the constructed Multiple Impulse Generator, MIGe. The physical and circuit parameters of the device are to be analyzed. The experiment results have shown that fast rise multiple lightning impulse have caused significant degradation on physical and LC circuit parameters of MOV |
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