Muhamad Amin, M. R. R. (2011). Modified pattern generator of built-in self test for sequential circuits with reduced test time.
Chicago Style (17th ed.) CitationMuhamad Amin, Muhamad Ridzuan Radin. Modified Pattern Generator of Built-in Self Test for Sequential Circuits with Reduced Test Time. 2011.
MLA (8th ed.) CitationMuhamad Amin, Muhamad Ridzuan Radin. Modified Pattern Generator of Built-in Self Test for Sequential Circuits with Reduced Test Time. 2011.
Warning: These citations may not always be 100% accurate.