APA引文

Muhamad Amin, M. R. R. (2011). Modified pattern generator of built-in self test for sequential circuits with reduced test time.

Chicago Style (17th ed.) Citation

Muhamad Amin, Muhamad Ridzuan Radin. Modified Pattern Generator of Built-in Self Test for Sequential Circuits with Reduced Test Time. 2011.

MLA引文

Muhamad Amin, Muhamad Ridzuan Radin. Modified Pattern Generator of Built-in Self Test for Sequential Circuits with Reduced Test Time. 2011.

警告：這些引文格式不一定是100％准確.