Modified pattern generator of built-in self test for sequential circuits with reduced test time

Modified pattern generator of built-in self test for sequential circuits with reduced test time

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Bibliographic Details
Main Author: Muhamad Amin, Muhamad Ridzuan Radin
Format: Thesis
Published: 2011
Subjects:
TK Electrical engineering
Electronics Nuclear engineering
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spelling my-utm-ep.268582017-07-10T07:19:55Z Modified pattern generator of built-in self test for sequential circuits with reduced test time 2011 Muhamad Amin, Muhamad Ridzuan Radin TK Electrical engineering. Electronics Nuclear engineering 2011 Thesis http://eprints.utm.my/id/eprint/26858/ http://libraryopac.utm.my/client/en_AU/main/search/results?qu=Modified+pattern+generator+of+built-in+self+test+for+sequential+circuits+with+reduced+test+time&te= masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution Universiti Teknologi Malaysia
collection UTM Institutional Repository
topic TK Electrical engineering
Electronics Nuclear engineering
spellingShingle TK Electrical engineering
Electronics Nuclear engineering
Muhamad Amin, Muhamad Ridzuan Radin
Modified pattern generator of built-in self test for sequential circuits with reduced test time
description
format Thesis
qualification_level Master's degree
author Muhamad Amin, Muhamad Ridzuan Radin
author_facet Muhamad Amin, Muhamad Ridzuan Radin
author_sort Muhamad Amin, Muhamad Ridzuan Radin
title Modified pattern generator of built-in self test for sequential circuits with reduced test time
title_short Modified pattern generator of built-in self test for sequential circuits with reduced test time
title_full Modified pattern generator of built-in self test for sequential circuits with reduced test time
title_fullStr Modified pattern generator of built-in self test for sequential circuits with reduced test time
title_full_unstemmed Modified pattern generator of built-in self test for sequential circuits with reduced test time
title_sort modified pattern generator of built-in self test for sequential circuits with reduced test time
granting_institution Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department Faculty of Electrical Engineering
publishDate 2011
_version_ 1747815528113635328

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