APA (7th ed.) Citation

Ang, K. C. (2010). Software-based self-test with scan design at register transfer level for 16-bit RISC processor.

Chicago Style (17th ed.) Citation

Ang, Kim Chuan. Software-based Self-test with Scan Design at Register Transfer Level for 16-bit RISC Processor. 2010.

MLA (8th ed.) Citation

Ang, Kim Chuan. Software-based Self-test with Scan Design at Register Transfer Level for 16-bit RISC Processor. 2010.

Warning: These citations may not always be 100% accurate.