APA引文

Ang, K. C. (2010). Software-based self-test with scan design at register transfer level for 16-bit RISC processor.

Chicago Style (17th ed.) Citation

Ang, Kim Chuan. Software-based Self-test with Scan Design at Register Transfer Level for 16-bit RISC Processor. 2010.

MLA引文

Ang, Kim Chuan. Software-based Self-test with Scan Design at Register Transfer Level for 16-bit RISC Processor. 2010.

警告：這些引文格式不一定是100％准確.