Software-based self-test with scan design at register transfer level for 16-bit RISC processor
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2010
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my-utm-ep.269862012-07-30T07:25:19Z Software-based self-test with scan design at register transfer level for 16-bit RISC processor 2010 Ang, Kim Chuan TK Electrical engineering. Electronics Nuclear engineering 2010 Thesis http://eprints.utm.my/id/eprint/26986/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering |
| institution |
Universiti Teknologi Malaysia |
| collection |
UTM Institutional Repository |
| topic |
TK Electrical engineering Electronics Nuclear engineering |
| spellingShingle |
TK Electrical engineering Electronics Nuclear engineering Ang, Kim Chuan Software-based self-test with scan design at register transfer level for 16-bit RISC processor |
| description |
|
| format |
Thesis |
| qualification_level |
Master's degree |
| author |
Ang, Kim Chuan |
| author_facet |
Ang, Kim Chuan |
| author_sort |
Ang, Kim Chuan |
| title |
Software-based self-test with scan design at register transfer level for 16-bit RISC processor |
| title_short |
Software-based self-test with scan design at register transfer level for 16-bit RISC processor |
| title_full |
Software-based self-test with scan design at register transfer level for 16-bit RISC processor |
| title_fullStr |
Software-based self-test with scan design at register transfer level for 16-bit RISC processor |
| title_full_unstemmed |
Software-based self-test with scan design at register transfer level for 16-bit RISC processor |
| title_sort |
software-based self-test with scan design at register transfer level for 16-bit risc processor |
| granting_institution |
Universiti Teknologi Malaysia, Faculty of Electrical Engineering |
| granting_department |
Faculty of Electrical Engineering |
| publishDate |
2010 |
| _version_ |
1747815559665287168 |
