Software-based self-test with scan design at register transfer level for 16-bit RISC processor

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Main Author: Ang, Kim Chuan
Format: Thesis
Published: 2010
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id my-utm-ep.26986
record_format uketd_dc
spelling my-utm-ep.269862012-07-30T07:25:19Z Software-based self-test with scan design at register transfer level for 16-bit RISC processor 2010 Ang, Kim Chuan TK Electrical engineering. Electronics Nuclear engineering 2010 Thesis http://eprints.utm.my/id/eprint/26986/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution Universiti Teknologi Malaysia
collection UTM Institutional Repository
topic TK Electrical engineering
Electronics Nuclear engineering
spellingShingle TK Electrical engineering
Electronics Nuclear engineering
Ang, Kim Chuan
Software-based self-test with scan design at register transfer level for 16-bit RISC processor
description
format Thesis
qualification_level Master's degree
author Ang, Kim Chuan
author_facet Ang, Kim Chuan
author_sort Ang, Kim Chuan
title Software-based self-test with scan design at register transfer level for 16-bit RISC processor
title_short Software-based self-test with scan design at register transfer level for 16-bit RISC processor
title_full Software-based self-test with scan design at register transfer level for 16-bit RISC processor
title_fullStr Software-based self-test with scan design at register transfer level for 16-bit RISC processor
title_full_unstemmed Software-based self-test with scan design at register transfer level for 16-bit RISC processor
title_sort software-based self-test with scan design at register transfer level for 16-bit risc processor
granting_institution Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department Faculty of Electrical Engineering
publishDate 2010
_version_ 1747815559665287168