Built-in self test for phase-locked loop
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Published: |
2008
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| id |
my-utm-ep.32657 |
|---|---|
| record_format |
uketd_dc |
| spelling |
my-utm-ep.326572013-12-17T03:52:48Z Built-in self test for phase-locked loop 2008 Goh, Alvin Shing Chye QA75 Electronic computers. Computer science 2008 Thesis http://eprints.utm.my/id/eprint/32657/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering |
| institution |
Universiti Teknologi Malaysia |
| collection |
UTM Institutional Repository |
| topic |
QA75 Electronic computers Computer science |
| spellingShingle |
QA75 Electronic computers Computer science Goh, Alvin Shing Chye Built-in self test for phase-locked loop |
| description |
|
| format |
Thesis |
| qualification_level |
Master's degree |
| author |
Goh, Alvin Shing Chye |
| author_facet |
Goh, Alvin Shing Chye |
| author_sort |
Goh, Alvin Shing Chye |
| title |
Built-in self test for phase-locked loop
|
| title_short |
Built-in self test for phase-locked loop
|
| title_full |
Built-in self test for phase-locked loop
|
| title_fullStr |
Built-in self test for phase-locked loop
|
| title_full_unstemmed |
Built-in self test for phase-locked loop
|
| title_sort |
built-in self test for phase-locked loop |
| granting_institution |
Universiti Teknologi Malaysia, Faculty of Electrical Engineering |
| granting_department |
Faculty of Electrical Engineering |
| publishDate |
2008 |
| _version_ |
1747816055743447040 |