Ooi, C. Y. (2003). Object-oriented test pattern generator and logic simulator for combinational circuits.
Chicago Style (17th ed.) CitationOoi, Chia Yee. Object-oriented Test Pattern Generator and Logic Simulator for Combinational Circuits. 2003.
MLA引文Ooi, Chia Yee. Object-oriented Test Pattern Generator and Logic Simulator for Combinational Circuits. 2003.
警告:這些引文格式不一定是100%准確.