IC test based on scan cell
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة |
| منشور في: |
2001
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| الموضوعات: | |
| الوسوم: |
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| id |
my-utm-ep.43231 |
|---|---|
| record_format |
uketd_dc |
| spelling |
my-utm-ep.432312014-11-02T03:30:00Z IC test based on scan cell 2001 Rahiman, Rosdina TK Electrical engineering. Electronics Nuclear engineering 2001 Thesis http://eprints.utm.my/id/eprint/43231/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering |
| institution |
Universiti Teknologi Malaysia |
| collection |
UTM Institutional Repository |
| topic |
TK Electrical engineering Electronics Nuclear engineering |
| spellingShingle |
TK Electrical engineering Electronics Nuclear engineering Rahiman, Rosdina IC test based on scan cell |
| description |
|
| format |
Thesis |
| qualification_level |
Master's degree |
| author |
Rahiman, Rosdina |
| author_facet |
Rahiman, Rosdina |
| author_sort |
Rahiman, Rosdina |
| title |
IC test based on scan cell |
| title_short |
IC test based on scan cell |
| title_full |
IC test based on scan cell |
| title_fullStr |
IC test based on scan cell |
| title_full_unstemmed |
IC test based on scan cell |
| title_sort |
ic test based on scan cell |
| granting_institution |
Universiti Teknologi Malaysia, Faculty of Electrical Engineering |
| granting_department |
Faculty of Electrical Engineering |
| publishDate |
2001 |
| _version_ |
1747816962764832768 |