IC test based on scan cell

مواد مشابهة

• Software-based self-test with scan design at register transfer level for 16-bit RISC processor
  بواسطة: Ang, Kim Chuan
  منشور في: (2010)
• Frontside And Backside Fault Localization Techniques On IC Leakage Failures
  بواسطة: Lau, Chee Kiang
  منشور في: (2011)
• Lna Ic Design For Cognitive Radio Implementation
  بواسطة: Cheong , Chee Han
  منشور في: (2013)
• Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
  بواسطة: Salehuddin, Muhammad Redzwan
  منشور في: (2017)
• Parallel scan in BIST environment
  بواسطة: Yusuf, Rihana
  منشور في: (2001)