Parallel scan in BIST environment

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主要作者: Yusuf, Rihana
格式: Thesis
出版: 2001
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id my-utm-ep.43290
record_format uketd_dc
spelling my-utm-ep.432902014-11-02T03:30:06Z Parallel scan in BIST environment 2001 Yusuf, Rihana TK Electrical engineering. Electronics Nuclear engineering 2001 Thesis http://eprints.utm.my/id/eprint/43290/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution Universiti Teknologi Malaysia
collection UTM Institutional Repository
topic TK Electrical engineering
Electronics Nuclear engineering
spellingShingle TK Electrical engineering
Electronics Nuclear engineering
Yusuf, Rihana
Parallel scan in BIST environment
description
format Thesis
qualification_level Master's degree
author Yusuf, Rihana
author_facet Yusuf, Rihana
author_sort Yusuf, Rihana
title Parallel scan in BIST environment
title_short Parallel scan in BIST environment
title_full Parallel scan in BIST environment
title_fullStr Parallel scan in BIST environment
title_full_unstemmed Parallel scan in BIST environment
title_sort parallel scan in bist environment
granting_institution Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department Faculty of Electrical Engineering
publishDate 2001
_version_ 1747816977133469696