Random power supply as a test vector to expose soft defects in CMOS digital circuits

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Bibliographic Details
Main Author:	Kamisian, Izam
Format:	Thesis
Published:	2000
Subjects:	TK Electrical engineering Electronics Nuclear engineering
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id	my-utm-ep.43626
record_format	uketd_dc
spelling	my-utm-ep.436262014-11-02T03:35:37Z Random power supply as a test vector to expose soft defects in CMOS digital circuits 2000 Kamisian, Izam TK Electrical engineering. Electronics Nuclear engineering 2000 Thesis http://eprints.utm.my/id/eprint/43626/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution	Universiti Teknologi Malaysia
collection	UTM Institutional Repository
topic	TK Electrical engineering Electronics Nuclear engineering
spellingShingle	TK Electrical engineering Electronics Nuclear engineering Kamisian, Izam Random power supply as a test vector to expose soft defects in CMOS digital circuits
description
format	Thesis
qualification_level	Master's degree
author	Kamisian, Izam
author_facet	Kamisian, Izam
author_sort	Kamisian, Izam
title	Random power supply as a test vector to expose soft defects in CMOS digital circuits
title_short	Random power supply as a test vector to expose soft defects in CMOS digital circuits
title_full	Random power supply as a test vector to expose soft defects in CMOS digital circuits
title_fullStr	Random power supply as a test vector to expose soft defects in CMOS digital circuits
title_full_unstemmed	Random power supply as a test vector to expose soft defects in CMOS digital circuits
title_sort	random power supply as a test vector to expose soft defects in cmos digital circuits
granting_institution	Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department	Faculty of Electrical Engineering
publishDate	2000
_version_	1747817059157278720

Random power supply as a test vector to expose soft defects in CMOS digital circuits

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