Mechanism-based reliability model for electronic packages
Mechanism-based reliability model is different from the conventional reliability model. It is generated based on a specific failure. The failure mechanism is studied in detail to obtain a model that incorporates all significant stressing variables. For fatigue driven failure, Coffin-Manson equation...
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Main Author: | Ng, Chee Weng |
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Format: | Thesis |
Language: | English |
Published: |
2005
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Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/4369/1/NgCheeWengMFKM2005.pdf |
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