Die defect classification using image processing

Die defect classification using image processing

This work presents die defect classification using image processing. The detection of the flaw is based on the defect features in the die. Each unique defect or feature structure is defined from samples that has been collected by Visual Inspection Inspectors. The defects are then grouped into user d...

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书目详细资料
主要作者:	Maniam, Darmadevaindra
格式:	Thesis
语言:	English
出版:	2015
主题:	TK Electrical engineering Electronics Nuclear engineering
在线阅读:	http://eprints.utm.my/id/eprint/53921/1/DarmadevaindraManiamMFKE2015.pdf
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