Control chart patterns recognition with constrained data
Recognition and classification of non-random patterns of manufacturing process data can provide clues to the possible causes that contributed to the product defects. Early detection of abnormal process patterns, particularly in highly precise and rapid automated manufacturing is necessary to avoid w...
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| 主要作者: | |
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| 格式: | Thesis |
| 語言: | English |
| 出版: |
2019
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| 主題: | |
| 在線閱讀: | http://eprints.utm.my/id/eprint/98011/1/RaziehHaghighatiPSKM2019.pdf |
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