A parallel built-in self-test design for photon counting array

Test module’s architectures and methodologies that would maximize test capability to filter out faulty chip after fabrication is highly demanded for chip cost reduction. A high-speed frequency Built-in Self-test (BIST) module is playing an increasingly large part in overall efficiency and quality of...

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Bibliographic Details
Main Author: Png, Ricky Keh Jing
Format: Thesis
Language:English
Published: 2022
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Online Access:http://eprints.utm.my/id/eprint/99566/1/PngKehJingMSKE2022.pdf
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