Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach
The Complementary Metal Oxide Semiconductor (CMOS) is a complex and delicate process in the semiconductor industry. In typical 30,000 wafer capacity of a single foundry business model, the CMOS products are mixed of various technologies to serve wider market segments. Total devices range from 100 to...
Saved in:
Main Author: | |
---|---|
Format: | Thesis |
Language: | eng eng eng eng |
Published: |
2019
|
Subjects: | |
Online Access: | https://etd.uum.edu.my/8440/1/Deposit%20Permission_s95698.pdf https://etd.uum.edu.my/8440/2/s95698_01.pdf https://etd.uum.edu.my/8440/3/s95698_02.pdf https://etd.uum.edu.my/8440/4/s95698%20references.docx |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
my-uum-etd.8440 |
---|---|
record_format |
uketd_dc |
spelling |
my-uum-etd.84402021-07-12T08:33:51Z Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach 2019 Mohamad Zambri, Mohd Darudin Ashaari, Hasbullah Nordin, Norani College of Business (COB) College of Business (COB) HD28-70 Management. Industrial Management The Complementary Metal Oxide Semiconductor (CMOS) is a complex and delicate process in the semiconductor industry. In typical 30,000 wafer capacity of a single foundry business model, the CMOS products are mixed of various technologies to serve wider market segments. Total devices range from 100 to 200 devices. This situation has created variables for process time, equipment usages and number of processing steps which lead to inconsistent work-in-progress (WIP) profiling at respective time periods. The main objective for this study is to achieve an optimal solution to the wafer fabrication. In such a complex system, it is important to develop a way to detect the floating and dynamic bottleneck. This study employed the classical usage of Action Research method, which involves the researcher and participants working together to identify and solve the problems. The comprehensive WIP profile could improves the operational management of high volumes of the wafer fabrication foundry. The system able to trace, identify, monitor and feedback the WIP spike to the factory manager for a real time decision. The segmentation of the WIP profile as PrePoly1, PrePoly2, Poly, PostPoly1, PostPoly2, Backend and Final zone improves the overall factory operation visibility to plan for the WIP movement. The results indicate that a dynamic WIP management approach improved the fabrication factory utilization up to 5%. .The segmentation of the WIP profile to 7 different segments is something that will improve the industry productivity and also body of knowledge, Depending of the industry, the WIP profile segmentation is something new to identify immediate constraint so that the factory authority able to take immediate action. 2019 Thesis https://etd.uum.edu.my/8440/ https://etd.uum.edu.my/8440/1/Deposit%20Permission_s95698.pdf text eng staffonly https://etd.uum.edu.my/8440/2/s95698_01.pdf text eng staffonly https://etd.uum.edu.my/8440/3/s95698_02.pdf text eng staffonly https://etd.uum.edu.my/8440/4/s95698%20references.docx text eng public other doctoral Universiti Utara Malaysia |
institution |
Universiti Utara Malaysia |
collection |
UUM ETD |
language |
eng eng eng eng |
advisor |
Ashaari, Hasbullah Nordin, Norani |
topic |
HD28-70 Management Industrial Management |
spellingShingle |
HD28-70 Management Industrial Management Mohamad Zambri, Mohd Darudin Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach |
description |
The Complementary Metal Oxide Semiconductor (CMOS) is a complex and delicate process in the semiconductor industry. In typical 30,000 wafer capacity of a single foundry business model, the CMOS products are mixed of various technologies to serve wider market segments. Total devices range from 100 to 200 devices. This situation has created variables for process time, equipment usages and number of processing steps which lead to inconsistent work-in-progress (WIP) profiling at respective time periods. The main objective for this study is to achieve an optimal solution to the wafer fabrication. In such a complex system, it is important to develop a way to detect the
floating and dynamic bottleneck. This study employed the classical usage of Action Research method, which involves the researcher and participants working together to identify and solve the problems. The comprehensive WIP profile could improves the operational management of high volumes of the wafer fabrication foundry. The system able to trace, identify, monitor and feedback the WIP spike to the factory manager for a real time decision. The segmentation of the WIP profile as PrePoly1, PrePoly2, Poly, PostPoly1, PostPoly2, Backend and Final zone improves the overall factory operation visibility to plan for the WIP movement. The results indicate that a dynamic WIP management approach improved the fabrication factory utilization up to 5%. .The segmentation of the WIP profile to 7 different segments is something that will improve the industry productivity and also body of knowledge, Depending of the industry, the WIP profile segmentation is something new to identify immediate constraint so that the factory authority able to take immediate action. |
format |
Thesis |
qualification_name |
other |
qualification_level |
Doctorate |
author |
Mohamad Zambri, Mohd Darudin |
author_facet |
Mohamad Zambri, Mohd Darudin |
author_sort |
Mohamad Zambri, Mohd Darudin |
title |
Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach |
title_short |
Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach |
title_full |
Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach |
title_fullStr |
Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach |
title_full_unstemmed |
Development of comprehensive WIP performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach |
title_sort |
development of comprehensive wip performance monitoring system for semiconductor fabrication foundry: a qualitative action research approach |
granting_institution |
Universiti Utara Malaysia |
granting_department |
College of Business (COB) |
publishDate |
2019 |
url |
https://etd.uum.edu.my/8440/1/Deposit%20Permission_s95698.pdf https://etd.uum.edu.my/8440/2/s95698_01.pdf https://etd.uum.edu.my/8440/3/s95698_02.pdf https://etd.uum.edu.my/8440/4/s95698%20references.docx |
_version_ |
1747828393769959424 |