Mohd Hanif Kamaruddin. Characterizing the channel interface properties of vertical double-diffused metal-oxide semiconductor (DMOS) with charge pumping method.
Chicago Style (17th ed.) CitationMohd Hanif Kamaruddin. Characterizing the Channel Interface Properties of Vertical Double-diffused Metal-oxide Semiconductor (DMOS) with Charge Pumping Method.
MLA (8th ed.) CitationMohd Hanif Kamaruddin. Characterizing the Channel Interface Properties of Vertical Double-diffused Metal-oxide Semiconductor (DMOS) with Charge Pumping Method.
Warning: These citations may not always be 100% accurate.