Characterizing the channel interface properties of vertical double-diffused metal-oxide semiconductor (DMOS) with charge pumping method /

Characterizing the channel interface properties of vertical double-diffused metal-oxide semiconductor (DMOS) with charge pumping method /

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书目详细资料
主要作者:	Mohd Hanif Kamaruddin (Author)
格式:	Thesis 图书
语言:	English
主题:	Silicon oxide. Metal oxide semiconductors > Materials. Integrated circuits > Design.
标签:	添加标签没有标签, 成为第一个标记此记录!

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