Karim, N. M. (2015). Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric.
Chicago Style (17th ed.) CitationKarim, Nissar Mohammad. Negative Bias Temperature Instability and Permittivity Dependent Delay Mitigation in High-K Metal Oxide Compatible Cmos Dielectric. 2015.
MLA (8th ed.) CitationKarim, Nissar Mohammad. Negative Bias Temperature Instability and Permittivity Dependent Delay Mitigation in High-K Metal Oxide Compatible Cmos Dielectric. 2015.
Warning: These citations may not always be 100% accurate.