Karim, N. M. (2015). Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric.
Chicago Style (17th ed.) CitationKarim, Nissar Mohammad. Negative Bias Temperature Instability and Permittivity Dependent Delay Mitigation in High-K Metal Oxide Compatible Cmos Dielectric. 2015.
MLA引文Karim, Nissar Mohammad. Negative Bias Temperature Instability and Permittivity Dependent Delay Mitigation in High-K Metal Oxide Compatible Cmos Dielectric. 2015.
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