Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric /
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Main Author: | |
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Format: | Thesis Book |
Language: | English |
Published: |
2015.
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Subjects: | |
Online Access: | http://studentsrepo.um.edu.my/id/eprint/7563 |
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Physical Description: | xix, 168 leaves : illustrations ; 30 cm. Also issued in CD. |
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Bibliography: | Bibliography: leaves 137-152. |