Olabisi, O. K. (2022). Development of holmium oxide thin film as high-k gate dielectric based on silicon carbide substrate.
Chicago Style (17th ed.) CitationOlabisi, Odesanya Kazeem. Development of Holmium Oxide Thin Film as High-k Gate Dielectric Based on Silicon Carbide Substrate. 2022.
MLA引文Olabisi, Odesanya Kazeem. Development of Holmium Oxide Thin Film as High-k Gate Dielectric Based on Silicon Carbide Substrate. 2022.
警告:這些引文格式不一定是100%准確.