Development of holmium oxide thin film as high-k gate dielectric based on silicon carbide substrate /

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Bibliographic Details
Main Author: Olabisi, Odesanya Kazeem (Author)
Format: Thesis Book
Language:English
Published: 2022.
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040 |a UMM  |e rda 
090 |a TJ7  |b UMP 2022 Ola 
100 1 |a Olabisi, Odesanya Kazeem,  |e author. 
245 1 0 |a Development of holmium oxide thin film as high-k gate dielectric based on silicon carbide substrate /  |c Odesanya Kazeem Olabisi. 
264 1 |c 2022. 
300 |a xxvi, 220 leaves :  |b illustrations (some colour) ;  |c 30 cm 
336 |a text  |2 rdacontent 
336 |a still image  |2 rdacontent 
337 |a unmediated  |2 rdamedia 
337 |a computer  |2 rdamedia 
338 |a volume  |2 rdacarrier 
338 |a computer disc  |2 rdacarrier 
502 |b Ph.D.  |c Jabatan Kejuruteraan Mekanik, Fakulti Kejuruteraan, Universiti Malaya  |d 2022. 
504 |a Bibiliography: leaves 193-219. 
530 |a Also issued in CD. 
710 2 |a Universiti Malaya.  |b Jabatan Kejuruteraan Mekanik,  |e degree granting institution. 
900 |a msp 
901 |a 090-1- copy in process. 
596 |a 1 
999 |a XX(1160438.1)  |w LC  |c 1  |i 1160438-1001  |l INPROCESS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 13/1/2023  |o .STAFF. tiada borang agreement