APA (7th ed.) Citation

Sim, K. S. (1990). Electron beam testing of integrated circuits using a modified scanning electron microscope.

Chicago Style (17th ed.) Citation

Sim, Kian Sin. Electron Beam Testing of Integrated Circuits Using a Modified Scanning Electron Microscope. 1990.

MLA (8th ed.) Citation

Sim, Kian Sin. Electron Beam Testing of Integrated Circuits Using a Modified Scanning Electron Microscope. 1990.

Warning: These citations may not always be 100% accurate.