Hu, P. Y. (1992). Copper-induced deep level defects in GaAs0.6P0.4 alloy semiconductor.
Chicago Style (17th ed.) CitationHu, Peh Yin. Copper-induced Deep Level Defects in GaAs0.6P0.4 Alloy Semiconductor. 1992.
MLA引文Hu, Peh Yin. Copper-induced Deep Level Defects in GaAs0.6P0.4 Alloy Semiconductor. 1992.
警告：这些引文格式不一定是100％准确.