A study of surface roughness measurement using fractal, FFT & pattern classification methods /

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Bibliographic Details
Main Author: Shi, Wei Min
Format: Thesis Book
Language:English
Published: 1994.
Subjects:
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LEADER 00857cam a2200253 a 4500
001 u369532
003 SIRSI
008 950322s1994 si v 00 1 eng m
035 |a ABV-3973 
040 |a UMM 
090 |a TA418.7  |b Shi 
100 1 0 |a Shi, Wei Min. 
245 1 2 |a A study of surface roughness measurement using fractal, FFT & pattern classification methods /  |c by Shi Wei Min. 
260 |c 1994. 
300 |a vii, 187 leaves :  |b ill. ;  |c 30 cm. 
500 |a Photocopy. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 1994. 
504 |a Bibliography: leaves 175-184. 
650 0 |a Surface roughness  |x Measurement. 
650 0 |a Fractals. 
650 0 |a Light  |x Scattering  |x Measurement 
948 |a 22/03/1995  |b 25/11/2000 
596 |a 1 
999 |a TA418.7 SHI  |w LC  |c 1  |i A505564438  |d 11/10/1996  |l STACKS  |m P01UTAMA  |n 2  |r Y  |s Y  |t TESIS  |u 22/4/1996