APA引文

Pey, K. S. (1994). Electron beam induced current/tunneling current microscopy of thin silicon dioxide films on silicon.

Chicago Style (17th ed.) Citation

Pey, Kin San. Electron Beam Induced Current/tunneling Current Microscopy of Thin Silicon Dioxide Films on Silicon. 1994.

MLA引文

Pey, Kin San. Electron Beam Induced Current/tunneling Current Microscopy of Thin Silicon Dioxide Films on Silicon. 1994.

警告：这些引文格式不一定是100％准确.