Electron beam induced current/tunneling current microscopy of thin silicon dioxide films on silicon /

Electron beam induced current/tunneling current microscopy of thin silicon dioxide films on silicon /

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書目詳細資料
主要作者:	Pey, Kin San
格式:	Thesis 圖書
語言:	English
出版:	1994.
主題:	Electron beams > Industrial applications. Metal oxide semiconductors Silicon > Defects Secondary ion mass spectrometry.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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