APA引文

Seah, B. P. (1995). Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors.

Chicago Style (17th ed.) Citation

Seah, Boon Pian. Modelling and Simulation of Hot-carrier Degradation in Submicrometre MOS Transistors. 1995.

MLA引文

Seah, Boon Pian. Modelling and Simulation of Hot-carrier Degradation in Submicrometre MOS Transistors. 1995.

警告：这些引文格式不一定是100％准确.