Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /

Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Seah, Boon Pian
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	1995.
الموضوعات:	Metal oxide semiconductors > Mathematical models Integrated circuits > Very large scale integration. Hot carriers. Semiconductor storage devices.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

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