Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /

Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /

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书目详细资料
主要作者:	Seah, Boon Pian
格式:	Thesis 图书
语言:	English
出版:	1995.
主题:	Metal oxide semiconductors > Mathematical models Integrated circuits > Very large scale integration. Hot carriers. Semiconductor storage devices.
标签:	添加标签没有标签, 成为第一个标记此记录!

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