Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /

相似書籍

• Characterization of hot-carrier degradation in submicrometer MOS transistors /
  由: Ang, Diing Shenp
  出版: (1997)
• Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /
  由: Lou, Choon Leong
  出版: (1997)
• Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
  由: Qin, Wei Han
  出版: (1998)
• Development of design framework to overcome aging degradation of 16NM VLSI technology circuits /
  由: Mahmoud, Mohamed Mounir
  出版: (2013)
• Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
  由: Tan, Suat Eng
  出版: (1997)