A built-in self-testable bit-slice processor /

A built-in self-testable bit-slice processor /

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Bibliographic Details
Main Author: Ibrahim Abubakr M.
Format: Thesis Book
Language:English
Published: 1995.
Subjects:
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Testing.
Microprocessors > Testing
Online Access:http://studentsrepo.um.edu.my/id/eprint/2392
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Description
Item Description:Microfiche. Kuala Lumpur : University of Malaya Library, 2000. 2 fiches : negative ; 11 x 15 cm.
Physical Description:115 leaves ; 30cm.
Bibliography:Includes bibliographical references.

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