A built-in self-testable bit-slice processor /

A built-in self-testable bit-slice processor /

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书目详细资料
主要作者:	Ibrahim Abubakr M.
格式:	Thesis 图书
语言:	English
出版:	1995.
主题:	Integrated circuits > Very large scale integration > Testing Integrated circuits > Testing. Microprocessors > Testing
在线阅读:	http://studentsrepo.um.edu.my/id/eprint/2392
标签:	添加标签没有标签, 成为第一个标记此记录!

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