Perera, M. T. C. (1995). A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films.
Chicago Style (17th ed.) CitationPerera, Merinnage Tamara Chandima. A Correlation of Oxide Trap Density and TDDB Characteristics of Very Thin SiO2 Films. 1995.
MLA (8th ed.) CitationPerera, Merinnage Tamara Chandima. A Correlation of Oxide Trap Density and TDDB Characteristics of Very Thin SiO2 Films. 1995.
Warning: These citations may not always be 100% accurate.