APA引文

Perera, M. T. C. (1995). A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films.

Chicago Style (17th ed.) Citation

Perera, Merinnage Tamara Chandima. A Correlation of Oxide Trap Density and TDDB Characteristics of Very Thin SiO2 Films. 1995.

MLA引文

Perera, Merinnage Tamara Chandima. A Correlation of Oxide Trap Density and TDDB Characteristics of Very Thin SiO2 Films. 1995.

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