Scanning electron microscope investigation of charging and discharging behavior in insulators /

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Bibliographic Details
Main Author: Chen, Hui
Format: Thesis Book
Language:English
Published: 1995.
Subjects:
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003 SIRSI
008 960625s1995 si v 00 1 eng m
035 |a ACA-4614 
040 |a UMM 
090 |a QC585.7  |b E43Che 
100 1 0 |a Chen, Hui. 
245 1 0 |a Scanning electron microscope investigation of charging and discharging behavior in insulators /  |c by Chen Hui. 
260 |c 1995. 
300 |a vi, 73 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Sc.) -- National University of Singapore, 1995. 
504 |a Includes bibliographical references. 
650 0 |a Electric discharges  |x Measurement 
650 0 |a Electrons  |x Scattering. 
650 0 |a Dielectrics. 
650 0 |a Electric insulators and insulation. 
948 |a 25/06/1996  |b 25/11/2000 
596 |a 1 
999 |a QC585.7 E43CHE  |w LC  |c 1  |i A505826397  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 15/8/1996