Koh, D. K. A. (1995). The influence of a layer of oxide on electromigration performance of Al/Cu/Si metal lines.
Chicago Style (17th ed.) CitationKoh, David Khar Ann. The Influence of a Layer of Oxide on Electromigration Performance of Al/Cu/Si Metal Lines. 1995.
MLA (8th ed.) CitationKoh, David Khar Ann. The Influence of a Layer of Oxide on Electromigration Performance of Al/Cu/Si Metal Lines. 1995.
Warning: These citations may not always be 100% accurate.