APA (7th ed.) Citation

Koh, D. K. A. (1995). The influence of a layer of oxide on electromigration performance of Al/Cu/Si metal lines.

Chicago Style (17th ed.) Citation

Koh, David Khar Ann. The Influence of a Layer of Oxide on Electromigration Performance of Al/Cu/Si Metal Lines. 1995.

MLA (8th ed.) Citation

Koh, David Khar Ann. The Influence of a Layer of Oxide on Electromigration Performance of Al/Cu/Si Metal Lines. 1995.

Warning: These citations may not always be 100% accurate.