APA引文

Koh, D. K. A. (1995). The influence of a layer of oxide on electromigration performance of Al/Cu/Si metal lines.

Chicago Style (17th ed.) Citation

Koh, David Khar Ann. The Influence of a Layer of Oxide on Electromigration Performance of Al/Cu/Si Metal Lines. 1995.

MLA引文

Koh, David Khar Ann. The Influence of a Layer of Oxide on Electromigration Performance of Al/Cu/Si Metal Lines. 1995.

警告：這些引文格式不一定是100％准確.