Ong, V. K. S. (1995). An investigation into the electron beam induced current effects on semiconductor materials and devices.
Chicago Style (17th ed.) CitationOng, Vincent Keng Sian. An Investigation into the Electron Beam Induced Current Effects on Semiconductor Materials and Devices. 1995.
MLA引文Ong, Vincent Keng Sian. An Investigation into the Electron Beam Induced Current Effects on Semiconductor Materials and Devices. 1995.
警告：这些引文格式不一定是100％准确.