Secondary ions emission from Si(100) /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1996.
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| Subjects: | |
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| LEADER | 00797cam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | u406001 | ||
| 003 | SIRSI | ||
| 008 | 961231s1996 si v 00 1 eng m | ||
| 035 | |a ACB-9545 | ||
| 040 | |a UMM | ||
| 090 | |a QC702.7 |b E4Low | ||
| 100 | 1 | 0 | |a Low, Heng Siong. |
| 245 | 1 | 0 | |a Secondary ions emission from Si(100) / |c by Low Heng Siong. |
| 260 | |c 1996. | ||
| 300 | |a 77 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Sc.) -- National University of Singapore, 1996. | ||
| 504 | |a Bibliography: leaves 76-77. | ||
| 650 | 0 | |a Secondary ion emission. | |
| 650 | 0 | |a Secondary ion mass spectrometry. | |
| 650 | 0 | |a Silicon |x Surfaces. | |
| 650 | 0 | |a Silicon |x Spectra. | |
| 948 | |a 31/12/1996 |b 25/11/2000 | ||
| 596 | |a 1 | ||
| 999 | |a QC702.7 E4LOW |w LC |c 1 |i A506477665 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 18/3/1997 | ||