Electrical characterisation of MOS gate oxide /

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Bibliographic Details
Main Author: Ooi, Joo Aik
Format: Thesis Book
Language:English
Published: 1996.
Subjects:
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LEADER 00789cam a2200241 a 4500
001 u406013
003 SIRSI
008 970102s1996 si v 00 1 eng m
035 |a ACB-9574 
040 |a UMM 
090 |a TK7871.99  |b M44Ooi 
100 1 0 |a Ooi, Joo Aik. 
245 1 0 |a Electrical characterisation of MOS gate oxide /  |c by Ooi Joo Aik. 
260 |c 1996. 
300 |a xii, 89, [2] leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 1996. 
504 |a Includes bibliographical references. 
650 0 |a Metal oxide semiconductors. 
650 0 |a Capacitors. 
650 0 |a Dielectric devices 
948 |a 02/01/1997  |b 31/07/1998 
596 |a 1 
999 |a TK7871.99 M44OOI  |w LC  |c 1  |i A506477718  |d 11/3/1999  |l STACKS  |m P01UTAMA  |n 2  |r Y  |s Y  |t TESIS  |u 30/1/1997