APA (7th ed.) Citation

Wu, Z. (1996). Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors.

Chicago Style (17th ed.) Citation

Wu, Zongmin. Computer Controlled Transient Capacitance Measurement and Analysis of Deep Levels in Semiconductors. 1996.

MLA (8th ed.) Citation

Wu, Zongmin. Computer Controlled Transient Capacitance Measurement and Analysis of Deep Levels in Semiconductors. 1996.

Warning: These citations may not always be 100% accurate.