Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /

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Bibliographic Details
Main Author: Wu, Zongmin
Format: Thesis Book
Language:English
Published: 1996.
Subjects:
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LEADER 00851cam a2200241 a 4500
001 u406113
003 SIRSI
008 970103s1996 si v 00 10 eng m
035 |a ACB-9776 
040 |a UMM 
090 |a QC611.6  |b D4Wu 
100 1 0 |a Wu, Zongmin. 
245 1 0 |a Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /  |c by Wu Zongmin. 
260 |c 1996. 
300 |a ii, 91, 58 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Sc.) -- National University of Singapore, 1996. 
504 |a Bibliography: leaves 88-91. 
650 0 |a Semiconductors  |x Defects  |x Measurement. 
650 0 |a Semiconductors  |x Impurities. 
650 0 |a Capacitance meters  |x Data processing. 
948 |a 03/01/1997  |b 25/11/2000 
596 |a 1 
999 |a QC611.6 D4WU  |w LC  |c 1  |i A506477530  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 28/4/1997