rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors
  name:
    name part: Wu, Zongmin.
    role:
      role term: creator
  type of resource: text
  genre: legal case and case notes
  origin info:
    place:
      place term: si
    date issued: 1996
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: ii, 91, 58 leaves : ill. ; 30 cm.
  note: by Wu Zongmin.
  note: Dissertation (M.Sc.) -- National University of Singapore, 1996.
  note: Bibliography: leaves 88-91.
  subject:
    topic: Semiconductors
    topic: Defects
    topic: Measurement
  subject:
    topic: Semiconductors
    topic: Impurities
  subject:
    topic: Capacitance meters
    topic: Data processing
  record info:
    record content source: UMM
    record creation date: 970103
    record identifier: u406113