Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /

Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /

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書目詳細資料
主要作者:	Wu, Zongmin
格式:	Thesis 圖書
語言:	English
出版:	1996.
主題:	Semiconductors > Defects > Measurement. Semiconductors > Impurities. Capacitance meters > Data processing.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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